Hot Sale Zbl-P8100 Foundation Pile Dynamic Tester

Product Details
Customization: Available
Certification: CE
Condition: New
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  • Hot Sale Zbl-P8100 Foundation Pile Dynamic Tester
  • Hot Sale Zbl-P8100 Foundation Pile Dynamic Tester
  • Hot Sale Zbl-P8100 Foundation Pile Dynamic Tester
  • Hot Sale Zbl-P8100 Foundation Pile Dynamic Tester
  • Hot Sale Zbl-P8100 Foundation Pile Dynamic Tester
  • Hot Sale Zbl-P8100 Foundation Pile Dynamic Tester
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Basic Info.

Model NO.
Zbl-P8100
Sampling Time Interval (μ S)
1~64000
Dynamic Range (dB)
100
System Noise Voltage (μ V)
≤30
a/D Resolution Ratio
24 Bit a / D
Number of Channels
2
Host Volume (mm)
240×187×50
Transport Package
Carton
Specification
240*187*50mm
Trademark
CHHGC
Origin
China
Production Capacity
5000 Pieces/Year

Packaging & Delivery

Package Size
24.00cm * 19.00cm * 5.00cm
Package Gross Weight
1.300kg

Product Description

ZBL-P8100 Foundation pile dynamic tester
Hot Sale Zbl-P8100 Foundation Pile Dynamic Tester
CERTIFICATIONS
Hot Sale Zbl-P8100 Foundation Pile Dynamic TesterHot Sale Zbl-P8100 Foundation Pile Dynamic Tester
PARTNER
Hot Sale Zbl-P8100 Foundation Pile Dynamic Tester
TECHNICAL SPECIFICATION
  
name

product model
qualification
ZBL-P8100 ZBL-P8000
main control unit The A8 embedded platform See also the tablet-related parameters
Display (time) 5.7 semi-reverse and semi-transparent, high brightness, TFT color LCD screen
Storage mode (GB) Internal electronic hard drive 4
mode of operation Keys + touch screen
Fixed point amplification 1,2,5,10,20,50,100 times seven gear adjustable 1,2,4,8,16,32 times six gear adjustable
A/D resolution ratio True 24-bit A / D True 24-bit A / D
sampling period (μs) 1~64000 more than adjustable 6.4~1638.4 Multi-file adjustable
Maximum sampling length 4096 2048
Trigger way Signal trigger Signal trigger
System noise voltage (mV) ≤1 ≤2
dynamic range (dB) ≥184 2144
Amp-frequency band (Hz) 1~10k 1~10k
Maximum storage length 4096 2048
The amplitude nonlinearity, (%) ≤10
Time shows the value error (%) ≤1
Time resolution (μ s) 1 6.4
gain error (dB) ≤1
operate time (h) >8 >8
number of channels 2 1
Interchannel crosstalk, (%) ≤1 not have
Sensor sensitivity (acceleration type) (mV / g) ≥100
Sensor frequency range (Acceleration type) (Hz) 0.5~9000
communication interface Dual USB interface (main port + slave port) See also the tablet-related parameters
wireless network have
power supply mode built-in lithium cell
outlay 220V AC/DC
Host weight (kg) 1.3 (including built-in lithium battery) 0.34 (including built-in lithium battery)
Host size (mm) 210×149×60 Medium, 50,120
work environment temperature (ºC) -10~+50 0~+40
humidity (RH) <90%
Cloud upload support support
Aviation battery certification not have have
APPLICATION FIELD
The reflection wave method is used to detect the integrity of foundation pile and determine the degree and position of pile defects. It can be used to test cast-in-place piles and drive piles, or for top-exposed structures (such as piers, etc.).
CHARACTERISTICS
> High-fidelity system design to ensure that the original acquisition waveform is not distorted.> True 24-bit A / D data collection, the test waveform is more real, to avoid the noise and signal distortion caused by floating point amplification, the pile bottom signal is clearer.> True 1 MHz high-speed data acquisition, the minimum sampling time resolution of 1 μ s, can obtain more useful signals, more conducive to the discovery of superficial defects.> "Touch screen + button" dual operation mode is convenient and fast, more can adapt to the harsh environment.> Dual-channel design, can accurately measure the speed of the reflected wave, can be collected from two positions at the same time, to meet the needs of data analysis under special circumstances.> Wavelet analysis processing method can more accurately judge the integrity of the pile in complex situations.> Double material injection molding, beautiful shape, waterproof, anti-fall design, the protection level reaches IP65. > Semi-anti and semi-transparent, high brightness, TFT color LCD screen, clearer in the sun.

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